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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity - Measurement of radiated immunity. Surface scan methodMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 978 0 580 79947 1 |
| ICS | 31.200 : Integrated circuits. Microelectronics |
| Number of pages | 32 |
| Cross references | IEC TS 62132-9:2014 |
| Year | 2014 |
| Country | United Kingdom |
| Keyword | PD IEC/TS 62132-9 ; PDIEC/TS62132-9 ; PD IEC/TS 621329 ; PD IEC/TS 62132:9 ; PD IECTS 62132-9 ; PDIEC/TS 62132 9 ; PD IEC/TS62132 9 |