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DD ISO/TR 15969:2001
Surface chemical analysis. Depth profiling. Measurement of sputtered depth partTitleEN sectionTitleENMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 0 580 38501 9 |
| ICS | 71.040.40 : Chemical analysis 17.040.20 : Properties of surfaces |
| Number of pages | 22 |
| Cross references | ISO/TR 15969:2001 |
| Year | 2001 |
| Country | United Kingdom |