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DD ISO/TS 21749:2005
Measurement and uncertainty for metrological applications. Repeated measurements and nested experimentsMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| EAN ISBN | 0 580 45979 9 |
| ICS | 17.020 : Metrology and measurement in general |
| Number of pages | 48 |
| Cross references | ISO/TS 21749:2005 |
| Set | MYSTD-20STD |
| Year | 2005 |
| Country | United Kingdom |
| Keyword | DD ISO/TS 21749 ; DDISO/TS21749 ; DD ISOTS 21749 ; DDISO/TS 21749 ; DD ISO/TS21749 |