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BS ISO 18516:2006
Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolutionMore info
| Author | BSI |
|---|---|
| Editor | BSI |
| Document type | Standard |
| Format | File |
| Confirmation date | 2010-06-01 |
| EAN ISBN | 0 580 49610 4 |
| ICS | 71.040.40 : Chemical analysis |
| Number of pages | 34 |
| Cross references | ISO 18516:2006 |
| Set | MYSTD-20STD |
| Year | 2006 |
| Country | United Kingdom |
| Keyword | BS ISO 18516 ; BSISO18516 ; BSISO 18516 ; BS ISO18516 |