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IEC 62132-1 (2015-10)

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IEC 62132-1 (2015-10)

IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

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IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.

Author IEC
Editor CEI
Document type Standard
Format File
Edition 2.0
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 49
Replace IEC 62132-1 (2006-01)
Cross references DIN EN 62132-1 (2016-09), IDT
Year 2015
Document history IEC 62132-1 (2015-10)
IEC 47A/974/FDIS (2015-07)
Country Switzerland
Keyword IEC62132;IEC 62132-1:2015