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IEC 62228-2 (2016-11)

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IEC 62228-2 (2016-11)

IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

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IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).

Author IEC
Editor CEI
Document type Standard
Format File
Edition 1.0
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 85
Year 2016
Country Switzerland
Keyword IEC62228;IEC 62228-2:2016