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IEC 62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
Author | IEC |
---|---|
Editor | CEI |
Document type | Standard |
Format | File |
Edition | 1.0 |
ICS | 31.080.99 : Other semiconductor devices |
Number of pages | 39 |
Year | 2018 |
Country | Switzerland |
Keyword | IEC62969;IEC 62969-4:2018 |