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IEC/TS 62876-2-1 (2018-08)

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IEC/TS 62876-2-1 (2018-08)

IEC TS 62876-2-1:2018 Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

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IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.

Author IEC
Editor CEI
Document type Standard
Format File
Edition 1.0
ICS 27.160 : Solar energy engineering
07.120 : Nanotechnologies
Number of pages 30
Year 2018
Country International
Keyword IEC62876;IEC TS 62876-2-1:2018