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BS PD CEN ISO/TR 20659‑2:2024
BS PD CEN ISO/TR 20659‑2:2024 Rheological test methods. Fundamentals...
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BS PD ISO/IEC TS 18013‑7:2024
BS PD ISO/IEC TS 18013‑7:2024 Historical[ Withdrawn ] Personal...
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BS PD ISO/TS 20790:2024
BS PD ISO/TS 20790:2024 Oil and gas industries including lower carbon...
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BS PD CEN ISO/TR 8124‑8:2024
BS PD CEN ISO/TR 8124‑8:2024 Safety of toys - Age determination. First...
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BS PD ISO/IEC TS 8236-2:2025
BS PD ISO/IEC TS 8236-2:2025 Information technology. Provisioning,...
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BS PD CEN/TR 14380:2024
BS PD CEN/TR 14380:2024 Lighting applications. Tunnel lighting standard...
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BS PD ISO/TR 17748‑1:2024
BS PD ISO/TR 17748‑1:2024 Intelligent transportation systems....
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ETSI TS 155 218
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EIA/TIA-1041-A:2007
EIA/TIA-1041-A:2007 Broadcast and Multicast Service in cdma2000 Wireless IP Network
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EIA JEP 114.01:2007 (R2013)
EIA JEP 114.01:2007 (R2013) Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification
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EIA JESD 208:2007
EIA JESD 208:2007 SPECIALITY DDR2-1066 SDRAM
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EIA JESD 61A.01:2007
EIA JESD 61A.01:2007 Isothermal Electromigration Test Procedure
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EIA JESD 22-B102E:2007
EIA JESD 22-B102E:2007 Solderability
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EIA JESD 89-1A:2007 (R2012)
EIA JESD 89-1A:2007 (R2012) Test Method for Real-Time Soft Error Rate
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EIA JESD 89-2A:2007 (R2012)
EIA JESD 89-2A:2007 (R2012) Test Method for Alpha Source Accelerated Soft Error Rate
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EIA/ECA-955:2007
EIA/ECA-955:2007 SURFACE MOUNT ALUMINUM ELECTROLYTIC CHIP CAPACITOR WITH POLYMER CATHODE (QUALIFICATION SPECIFICATION)
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EIA/TIA-455-128:2007
EIA/TIA-455-128:2007 Procedures for Determining Threshold Current of Semiconductor Lasers
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EIA/TIA-455-129:2007
EIA/TIA-455-129:2007 Procedures for Applying Human Body Model Electrostatic Discharge Stress to Package Optoelectronic Components
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EIA/TIA-455-130:2007
EIA/TIA-455-130:2007 Elevated Temperature Life Test for Laser Diodes
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EIA/TIA-785:2007
EIA/TIA-785:2007 100 Mb/s Physical Layer Medium Dependent Sublayer and 1-Mb/s Auto- Negotiation on 850nm Fiber Optics
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