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IEC 62065 Ed. 1.0 en:2002...
IEC 61811-55 Ed. 2.0 b:2002...
IEC 60749-4 (2017-03) IEC 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
IEC 61800-3 Redline version (2017-02) IEC 61800-3:2017 RLV Adjustable speed electrical power drive systems - Part 3: EMC requirements and specific test methods
IEC 60669-1 (2017-02) IEC 60669-1:2017 Switches for household and similar fixed-electrical installations - Part 1: General requirements
IEC 60669-1 Redline version (2017-02) IEC 60669-1:2017 RLV Switches for household and similar fixed-electrical installations - Part 1: General requirements
IEC/TS 62239-2 (2017-02) IEC TS 62239-2:2017 Process management for avionics - Management plan - Part 2: Preparation and maintenance of an electronic COTS assembly management plan
IEC 60695-1-30 (2017-02) IEC 60695-1-30:2017 Fire hazard testing - Part 1-30: Guidance for assessing the fire hazard of electrotechnical products - Preselection testing process - General guidelines
IEC 62841-3-13 (2017-02) IEC 62841-3-13:2017 Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 3-13: Particular requirements for transportable drills
IEC 61709 (2017-02) IEC 61709:2017 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 61709 Redline version (2017-02) IEC 61709:2017 RLV Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
IEC 60747-16-1 Edition 1.2 (2017-02) IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 consolidated version Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
IEC 60747-16-1 AMD 2 (2017-02) IEC 60747-16-1:2001/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
IEC/TR 62660-4 (2017-02) IEC TR 62660-4:2017 Secondary lithium-ion cells for the propulsion of electric road vehicles - Part 4: Candidate alternative test methods for the internal short circuit test of IEC 62660-3