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JIS C 5402-3-1:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 3-1: Insulation tests - Test 3a: Insulation resistance
JIS C 5402-4-2:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 4-2: Voltage stress tests - Test 4b: Partial discharge
JIS C 5402-4-3:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels
JIS C 5402-5-1:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
JIS C 5402-5-2:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating
JIS C 5402-6-1:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state
JIS C 5402-6-2:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 6-2: Dynamic stress tests - Test 6b: Bump
JIS C 5402-6-3:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 6-3: Dynamic stress tests - Test 6c: Shock
JIS C 5402-6-4:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal)
JIS C 5402-11-2:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 11-2: Climatic tests - Test 11b: Combined/sequential cold, low air pressure and damp heat
JIS C 5402-11-3:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
JIS C 5402-11-5:2005 (R2014) Connectors for electronic equipment - Tests and measurements - Part 11-5: Climatic tests - Test 11e: Mould growth