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BS PD CEN ISO/TR 20659‑2:2024
BS PD CEN ISO/TR 20659‑2:2024 Rheological test methods. Fundamentals...
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BS PD ISO/IEC TS 18013‑7:2024
BS PD ISO/IEC TS 18013‑7:2024 Historical[ Withdrawn ] Personal...
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BS PD ISO/TS 20790:2024
BS PD ISO/TS 20790:2024 Oil and gas industries including lower carbon...
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BS PD CEN ISO/TR 8124‑8:2024
BS PD CEN ISO/TR 8124‑8:2024 Safety of toys - Age determination. First...
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BS PD ISO/IEC TS 8236-2:2025
BS PD ISO/IEC TS 8236-2:2025 Information technology. Provisioning,...
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BS PD CEN/TR 14380:2024
BS PD CEN/TR 14380:2024 Lighting applications. Tunnel lighting standard...
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BS PD CEN/TR 16389:2025
BS PD CEN/TR 16389:2025 Automotive fuels. Paraffinic diesel fuel and...
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JIS There are 12276 products.
JIS C 4411-3:2014
JIS C 4411-3:2014 Uninterruptible power systems (UPS) - Part 3: Method of specifying the performance and test requirements
$26.94 $62.66 -57%In StockJIS C 0806-3:2014
JIS C 0806-3:2014 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
$19.79 $46.02 -57%In StockJIS C 5201-8:2014
JIS C 5201-8:2014 Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
$18.00 $41.86 -57%In StockJIS C 5101-21:2014
JIS C 5101-21:2014 Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
$19.79 $46.02 -57%In StockJIS C 5101-22:2014
JIS C 5101-22:2014 Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
$19.79 $46.02 -57%In StockJIS C 5630-12:2014
JIS C 5630-12:2014 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
$15.60 $36.27 -57%In StockJIS C 5630-13:2014
JIS C 5630-13:2014 Semiconductor devices - Micro-electromechanical devices - Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
$10.75 $25.00 -57%In StockJIS C 5402-15-2:2014
JIS C 5402-15-2:2014 Connectors for electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
$10.75 $25.00 -57%In StockJIS C 5402-15-3:2014
JIS C 5402-15-3:2014 Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
$10.75 $25.00 -57%In StockJIS C 5402-15-5:2014
JIS C 5402-15-5:2014 Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
$10.75 $25.00 -57%In StockJIS C 5402-16-1:2014
JIS C 5402-16-1:2014 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
$10.75 $25.00 -57%In StockJIS C 5402-16-6:2014
JIS C 5402-16-6:2014 Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations
$10.75 $25.00 -57%In Stock
