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BS PD ISO/IEC TS 24192-1:2021...
AS 4708-2007...
JIS C 4411-3:2014 Uninterruptible power systems (UPS) - Part 3: Method of specifying the performance and test requirements
JIS C 0806-3:2014 Packaging of components for automatic handling - Part 3: Packaging of surface mount components on continuous tapes
JIS C 5201-8:2014 Fixed resistors for use in electronic equipment - Part 8: Sectional specification - Fixed surface mount resistors
JIS C 5101-21:2014 Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
JIS C 5101-22:2014 Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
JIS C 5630-12:2014 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
JIS C 5630-13:2014 Semiconductor devices - Micro-electromechanical devices - Part 13: Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
JIS C 5402-15-2:2014 Connectors for electronic equipment - Tests and measurements - Part 15-2: Connector tests (mechanical) - Test 15b: Insert retention in housing (axial)
JIS C 5402-15-3:2014 Connectors for electronic equipment - Tests and measurements - Part 15-3: Connector tests (mechanical) - Test 15c: Insert retention in housing (torsional)
JIS C 5402-15-5:2014 Connectors for electronic equipment - Tests and measurements - Part 15-5: Connector tests (mechanical) - Test 15e: Contact retention in insert, cable nutation
JIS C 5402-16-1:2014 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
JIS C 5402-16-6:2014 Connectors for electronic equipment - Tests and measurements - Part 16-6: Mechanical tests on contacts and terminations - Test 16f: Robustness of terminations